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HANNOVER MESSE 2018, 23 - 27 April
Homepage>Conference program >Detact® - Optimization of process windows with technologic-statistical models
CAE-Forum

Detact® - Optimization of process windows with technologic-statistical models

Location & Language

Hall 6, Stand L46

Language

German

Event Details

Type of event

Lecture

Topic

Digital Factory, Industrie 4.0, Predictive Maintenance

Event series

CAE-Forum

Event Host

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Description

Detact® uses data produced permanently in test series and/or manufacturing processes, for instance in machines, electronic controls or various databases. With its high level of automation, online-capability and data integration, Detact® reduces the effort to understand and to develop complex technologies - the engineer gets the right information at the right time at the touch of a button.

Speaker

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