HANNOVER MESSE 2018, 23 - 27 April
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tech transfer Forum

Standardized PID-test method supports marketing of quality solar modules

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Hall 2, Stand C02



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Research & Technology

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tech transfer Forum

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With the DIN SPEC 91348, non-encapsulated silicon solar cells can be subjected to a standardized test procedure for the so-called potential-induced degradation (PID), one of the most frequent causes of severe power losses in photovoltaic modules. After discovering this effect, various expensive test methods for solar modules were developed. The test procedures described in the DIN SPEC do not require the cost-intensive production of complete solar modules and their testing in large environmental chambers. Instead, individual, non-encapsulated solar cells are tested at the same conditions under which PID occurs: increased temperatures and a high electrical potential between the front glass surface and the solar cell. The test apparatus developed on the basis of this PID cell test is of great interest, but had previously suffered from the disadvantage that no applicable test standard existed. This deficit was overcome through the publication of this DIN SPEC.


 Dr. Volker Naumann

Dr. Volker Naumann

Fraunhofer-Center für Silizium-Photovoltaik CSP

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