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HANNOVER MESSE 2019, 01 - 05 April
Homepage>Exhibitors & Products >Comprehensive sample analysis

Comprehensive sample analysis

Logo Open R&D Lithuania

Exhibitor

Open R&D Lithuania

Exhibitor details
Exhibitor details

Product description

1. Sample topology (SEM, optical microscopy, AFM and stylus profilometry).
2. Crystal structure analysis at room and elevated temperatures (in-situ XRD in vacuum or selected gas environment with temperatures up to 1500 °C).
3. Elemental and chemical composition analysis starting from the very top surface atomic monolayers (AES, XPS), through micrometre (EDS) and up to millimetre scale (GDS).
4. More specialized characterization such as ionicelectronic conductivity, gas sorption kinetics and thermodynamics, precise N2, O2 and H2 amount measurements in metals, surface (micro)hardness and others.

Hall 2, Stand A27

(Main stand)

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