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HANNOVER MESSE 2018, 23 - 27 April
Homepage>Exhibitors & Products >Development of magnetic probes for atomic-force microscopes

Development of magnetic probes for atomic-force microscopes

Zelenograd Nanotechnology Center

Exhibitor details
Logo Development of magnetic probes for atomic-force microscopes

Exhibition stand
Topic: Global Business & Markets

Product description

Development of magnetic probes for atomic-force microscopes to measure nanosized magnetic bodies.
Magnetic probes (nanocantelevers) for atomic-force microscopes (AFM) serve to render and measure nanosized magnetic bodies (10 - 100 nm).

Product fields of application: Visualisation of magnetic bodies on AFM. The results of project may be used for the development of other MEMS console devices.

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