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HANNOVER MESSE 2018, 23 - 27 April
Homepage>Exhibitors & Products >Development of magnetic probes for atomic-force microscopes

Development of magnetic probes for atomic-force microscopes

Logo Zelenograd Nanotechnology Center

Exhibitor

Zelenograd Nanotechnology Center

Exhibitor details
Exhibitor details
Logo Development of magnetic probes for atomic-force microscopes

Product description

Development of magnetic probes for atomic-force microscopes to measure nanosized magnetic bodies.
Magnetic probes (nanocantelevers) for atomic-force microscopes (AFM) serve to render and measure nanosized magnetic bodies (10 - 100 nm).

Product fields of application: Visualisation of magnetic bodies on AFM. The results of project may be used for the development of other MEMS console devices.

Product website

Hall 15, Stand B11

Moscow Export Center Pavilion Automation

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