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HANNOVER MESSE 2018, 23 - 27 April

LensAFM

Extend the resolution of your upright microscope or 3D profilometer

Logo LensAFM

Exhibition stand
Topic: German Pavilion - Bavaria Innovative

Hall 2, Stand A52

Product description

The Nanosurf LensAFM is an atomic force microscope that can be used as a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.

Key features and benefits

- Mounts on virtually every upright optical microscope or 3D optical profilometer
- Integrated motor for automated cantilever approach and engage
- Standard and extended AFM modes available through a modular controller

Product website

All products offered by this exhibitor

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NaniteAFM

The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures. Simple handling ...read more

Flex-FPM

Flex-FPM - FlexAFM with FluidFM® functionalityread more

LensAFM

Extend the resolution of your upright microscope or 3D profilometerread more

Nanosurf FlexAFM

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NaioAFM

The leading compact AFMread more

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