The M1 MISTRAL is a position sensitive small spot Micro-XRF spectrometer for metal alloys and coatings. The tabletop spectrometer provides non-destructive analysis of the composition and thickness of thin metal multilayers. Analysis with spectrometer's powerful and versatile XSpect Pro / XData package is performed in accordance with ASTM B568 and DIN/ISO 3497. Up to 12 layers (containing up to 25 elements per layer) can be analyzed. Application fields are the automotive and electronics industry, microelectronics, PCB (printed circuit boards) and GMF (general metal finishing).