The M1 ORA is the ideal compact Micro-XRF instrument for non-destructive analysis of jewelry, precious metals or coins - especially in situations where space is limited. Ease-of-use, a small footprint and rugged design combined with excellent analytical results are its main features. Using the M1 ORA individuals who have received only introductory training are able to generate reliable information on precious metal content within minutes.
The tabletop spectrometer provides non-destructive analysis of the composition and thickness of thin metal multilayers. Analysis with spectrometer's powerful and versatile XSpect Pro / XData package is performed in accordance with ASTM B568 and DIN/ISO 3497. Up to 12 layers (containing up to 25 elements per layer) can be analyzed. Application fields are jewellry analysis, the automotive and electronics industry, microelectronics, PCB (printed circuit boards) and GMF (general metal finishing).