HANNOVER MESSE 2018, 23 - 27 April


A new definition of Micro-XRF

Bruker Nano

Exhibitor details

Exhibition stand

Hall 6, Stand D35
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Product description

In addition to fast non-destructive element distribution analysis of large sample areas the M4 TORNADO Micro-XRF spectrometer provides analysis of the composition and thickness of thin metallic multilayers. The instrument's geometry is ideally suited for layer thickness determination. An unlimited number of layers and elements can be analyzed, only depending on the physical properties of the layers and elements present. For light elements analysis is performed in vacuum. The M4 TORNADO software supplies powerful data acquisition and evaluation. The system also includes the XData software, a versatile method editor for layer thickness determination and method development. Analysis is performed in accordance with ASTM B568 and DIN/ISO 3497. Application fields are the automotive and electronics industry, microelectronics, PCB (printed circuit boards) and GMF (general metal finishing).

Product website

All products offered by this exhibitor


M4 TORNADO Micro-XRF Spectrometerread more


The M1 ORA is the ideal compact Micro-XRF instrument for non-destructive analysis of jewelry, precious metals or coins - especially in situations where space is limited. Ease-of-use, a small footprint and rugged design combined with excellent analytical results are its main features. Using the M1 ORA more


The M1 MISTRAL is a position sensitive small spot Micro-XRF spectrometer for metal alloys and coatings. The tabletop spectrometer provides non-destructive analysis of the composition and thickness of thin metal multilayers. Analysis with spectrometer's powerful and versatile XSpect Pro / XData package more

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