HANNOVER MESSE 2020, 20 - 24 April
Homepage>Conference program >SIO X-Ray: View Inside Your Material Systems with Tribological Contact Experiments
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SIO X-Ray: View Inside Your Material Systems with Tribological Contact Experiments

Location & Language


German, English

Event Details

Type of event



Industrie 4.0, Predictive Maintenance, Research & Technology

Event series

tech transfer Forum


Research, Innovation & Technology for Things in Relative Motion

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Nowadays, material systems used in all application fields are getting more and more complex. These complex structures are needed in order to increase the lifetime of the components and to improve system properties. Especially in the field of tribology, these are very important values. This increased complexity demands extended analysis and optimization methods. Engineering knowledge alone is not enough anymore.   Proper characterization and optimization of such structures require invertible mathematical tools of sufficient holistic character. SIO developed analytical models that dramatically speed up the simulation compared to FEM systems.   Together with measurement devices, it is now possible to characterize such complex material stacks. SIO X-Ray will give a view inside the material to really see what happens during a contact experiment and it will make it easier to find initial failures.


 Dipl.-Inf. Nick Bierwisch

Dipl.-Inf. Nick Bierwisch

SIO® - Saxonian Institute of Surface Mechanics

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