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HANNOVER MESSE 2020, 20 - 24 April
Homepage>Conference program >Smart OEE Analytics: Next steps towards a zero defect, zero downtime production

Smart OEE Analytics: Next steps towards a zero defect, zero downtime production

Location & Language

Language

English

Event Details

Type of event

Product Pitch

Topic

Digital Factory

Event Host

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Speaker

  Etxezarreta Nora

Etxezarreta Nora

Big Data and Smart Manufacturing Consultant, IBERMÁTICA

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