Versatile, high throughput SEM from JEOL combined with the intuitive operation of a table-top SEM.
The JEOL JSM-IT210 is the latest addition to the successful InTouchScope series of scanning electron microscopes. Representing 50 years of industry and technological leadership, the IT210 is a simple-to-use, research-grade SEM with a compact ergonomic design.
With its expanded EDS analysis capabilities, the InTouchScope is a versatile workhorse SEM that can be configured to meet individual lab requirements at an exceptional value. It offers high-resolution imaging and continuously adaptable acceleration voltages at both high and low vacuum mode.
IT210’s intuitive use enables you to easily streamline workflows in any lab. Touchscreen operation or traditional keyboard and mouse interface are at the operator's fingertips. Fast data acquisition make imaging and analysis of samples a simple task.
Thanks to automatic parameter optimisation, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging with the IT210. The embedded JEOL EDS system with live analysis includes spectral mapping, multi-point analysis, automatic drift compensation, line scan, and mapping filter functions.
JEOL's popular InTouchScope series also includes the JSM-IT510 with a big sample chamber. It is available with tungsten, LaB6 or high-brightness filament.
FEATURES
• high resolution imaging in HV/LV/SE/BSE
• Zeromag-mode for intuitive transition from light-optic to SEM image
• chemical analysis with integrated EDS and live analysis
• multi-touch screen control and wireless operation
• automatic SEM condition setup based on sample type
• simultaneous multiple live image and movie capture
• fast sample navigation at 5x – 300,000x magnifications
• Smile View Premium with image sharpening, montaging, position alignment and overlay
• Compact floor space: ca. 0,5m²
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